Ballistic Electron Emission Microscopy

Views Updated: Dec 15, 2025

Key Facts

Abbreviation
BEEM
Pronunciation
/bəˈlɪstɪk ˌɪˈlɛktrɑn ɪˈmɪʃən maɪˈkrəskəpi/
Category
Academic & Science
Related Field
Physics

Examples in Context

  1. The local barrier heights of the CoSi 2 / Si contacts are determined by using the ballistic electron emission microscopy ( BEEM ) and its spectroscopy ( BEES ) at low temperature.
  2. Ultra-Thin Metal-Silicide / Si Schottky Contacts Studied by Ballistic Electron Emission Microscopy(BEEM)
  3. Two methods used in the microanalysis of semiconductor interfaces, Ballistic Electron Emission Microscopy(BEEM) ( BEEM ) and Scanning Internal Photoemission Microscopy ( SIPM ), are described.
  4. The Au / n-Si ( 100 ) interface system has been studied by the ballistic electron emission microscopy ( BEEM ). The barrier heights at different positions of the interface and interface images have been directly obtained with nanometer-scale resolution.
  5. Experimental Technology Ballistic Electron Emission Microscopy(BEEM) and its Applications

Other meanings of BEEM

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