Force Analyzer

Views Updated: Dec 15, 2025

Abbreviation

Pronunciation

/fɔrs ˈænəˌlaɪzər/

Transmission electron microscope ( TEM ), atomic force microscope ( AFM ), laser particles size analyzer, X-ray diffractometer ( XRD ) and vibrating samples magnetometer ( VSM ) were used to characterize the size distribution, crystal phase and magnetic property of the particles.
Physical and chemical properties of magnetic fluoresce nano-particles were characterized by infrared spectroscopy, atomic force microscopy, transmission electron microscopy, vibrating sample magnetometer and BET surface area analyzer.

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