Variable Angle Spectroscopic Ellipsometry
Key Facts
Abbreviation
VASE
Pronunciation
/ˌvɛəriəbəl ˈæŋɡəl ˌspɛktrəˈskɒpɪk ɪˌlɪpˈsɒmɪtri/
Category
Academic & Science
Related Field
Electronics
Examples in Context
- Based on the measurement method on optical film refractive index and thickness, commonly used in the world, a method which derived from variable angle spectroscopic ellipsometry is used to set the primary standard of optical film refractive index and thickness for national defense.