WithIn Wafer

Views Updated: Dec 15, 2025

Key Facts

Abbreviation
WIW
Pronunciation
/wɪˈθɪn ˈweɪfər/
Category
Academic & Science
Related Field
Electronics

Examples in Context

  1. This paper introduces that we can reduce Within wafer nonuniformity ( WIWNU ) to achieve part and full planarization by distributing the speed of polishing head and polis.
  2. The impurity of iron is one major heavy metal contamination on the silicon wafer. Surface photo voltage method ( SPV ) can be used to accurately measure the iron contamination within the silicon wafer.
  3. Chemical mechanical planarization ( CMP ) has gained wide acceptance within the semiconductor industry as the preferred method for controlling wafer topography.

Other meanings of WIW