Cross-sectional Transmission Electron Microscopy

Views Updated: Dec 15, 2025

Key Facts

Abbreviation
XTEM
Pronunciation
/krɔs ˈsɛkʃənəl trænzˈmɪʃən ˌɪˈlɛktrɑn maɪˈkrəskəpi/
Category
Academic & Science
Related Field
Electronics

Examples in Context

  1. Structural characterization and evolution of Fe / Ti nanometer-scale multilayers during thermal annealing at 473-873 K for 1 h were investigated by using small / wide angle x-ray diffraction, Rutherford backscattering spectrometry, cross-sectional transmission electron microscopy and differential scanning calorimetry.
  2. By using cross-sectional transmission electron microscopy ( XTEM ) the effect of post-implanted Ar ~ + on the secondary defects in high energy P ~ + - implanted silicon are investigated.
  3. Ion-irradiation-induced transition of single crystal Gd_2Zr_2O_7 pyrochlore was studied by cross-sectional transmission electron microscopy ( TEM ) and high-resolution TEM ( HRTEM ).
  4. Elastic Relaxation in Cross-sectional Transmission Electron Microscopy(XTEM) Specimens of Ge_xSi_ ( 1-x ) / Si Strained-layer Superlattices