Secondary Ion Mass Spectrometer

Views Updated: Dec 15, 2025

Key Facts

Abbreviation
SIMS
Pronunciation
/ˈsɛkənˌdɛri aɪən mæs spɛkˈtrɑmətər/
Category
Miscellaneous
Related Field
Unclassified

Examples in Context

  1. The FTE SAMs was characterized by the time-of-flight secondary ion mass spectrometer ( TOF-SIMS ), atomic force microscopy ( AFM ) and contact angle measurement, and the tribology properties of the FTE SAMs were measured by the Olympus head / disk interface reliability measurement system.
  2. A time-of-flight secondary ion mass spectrometer ( TOF-SIMS ), X-ray photoelectron spectroscopy ( XPS ), an atomic force microscopy ( AFM ), and contact angle measurements were used to characterize the monolayer.
  3. Particle Analysis in Nuclear Safeguards and Secondary Ion Mass Spectrometer(SIMS)
  4. The distribution of trace elements as Fe, Si, Cu, Mg, Mn and Zn in the surface layer was also determined by secondary ion mass spectrometer.
  5. The Secondary Ion Mass Spectrometer(SIMS) ( SIMS ), especially dynamic SIMS, is the most suitable instrument for particle isotopic analysis.

Other meanings of SIMS

Standardised Incident Management System Medical
Structured Inventory of Malingered Symptoms Medical
This term had 4 hits on 19.10.2011, and is thus likely retir Medical
Safety Information Management System Business
Synthes Inventory Management Solution Business
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Stock Exchange of Thailand Information Management System Business
Secondary Ion Mass Spectroscopy Academic
Stable Isotope Mass Spectrometer Academic
Societal Institute of the Mathematical Sciences Medical